Strachan, Douglas R

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  • Publication
    Real-Time TEM Imaging of the Formation of Crystalline Nanoscale Gaps
    (2008-02-08) Strachan, Douglas R; Davies, Peter K; Johnston, Danvers E; Bonnell, Dawn A; Guitton, Beth S; Johnson, Alan T; Datta, Sujit S
    We present real-time transmission electron microscopy of nanogap formation by feedback controlled electromigration that reveals a remarkable degree of crystalline order. Crystal facets appear during feedback controlled electromigration indicating a layer-by-layer, highly reproducible electromigration process avoiding thermal runaway and melting. These measurements provide insight into the electromigration induced failure mechanism in sub-20 nm size interconnects, indicating that the current density at failure increases as the width decreases to approximately 1 nm.