Departmental Papers (MSE)

Document Type

Journal Article

Date of this Version

12-3-2009

Abstract

The idealized system of an atomically flat metallic surface [highly oriented pyrolytic graphite (HOPG)] and an organic monolayer (porphyrin) was used to determine whether the dielectric function and associated properties of thin films can be accessed with scanning–near-field scanning optical microscopy (s-NSOM). Here, we demonstrate the use of harmonics up to fourth order and the polarization dependence of incident light to probe dielectric properties on idealized samples of monolayers of organic molecules on atomically smooth substrates. An analytical treatment of light/ sample interaction using the s-NSOM tip was developed in order to quantify the dielectric properties. The theoretical analysis and numerical modeling, as well as experimental data, demonstrate that higher order harmonic scattering can be used to extract the dielectric properties of materials with tens of nanometer spatial resolution. To date, the third harmonic provides the best lateral resolution(~50 nm) and dielectric constant contrast for a porphyrin film on HOPG.

Comments

Suggested Citation:
Nikiforov, M.P., et.al. (2009). "Probing polarization and dielectric function of molecules with higher order harmonics in scattering-near-field scanning optical microscopy." Journal of Applied Physics. 106, 114307.

© 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
http://dx.doi.org/10.1063/1.3245392

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Date Posted: 23 November 2010

This document has been peer reviewed.