The Impact of Imperfect Information in Multi-Channel Wireless Systems

Loading...
Thumbnail Image
Penn collection
Departmental Papers (ESE)
Degree type
Discipline
Subject
Electrical and Computer Engineering
Engineering
Funder
Grant number
License
Copyright date
Distributor
Related resources
Contributor
Abstract

We consider a wireless system with multiple channels when each channel has several different transmission states associated with different probabilities of successful transmissions. Hardware limitations and MAC protocols dictate that the channel be switched only after certain intervals, and the channel needs to be selected based on the channel states at the beginning of the interval. We demonstrate that the fundamental relations between QoS metrics like throughput and stability significantly change owing to the lack of complete information. We obtain a randomized channel selection and threshold-type transmission rule that maximizes throughput while using imperfect information. Using this optimal strategy, we numerically quantify the penalty associated with different amounts of imperfections in the available information.

Advisor
Date of presentation
2005-12-01
Conference name
Departmental Papers (ESE)
Conference dates
2023-05-17T05:27:22.000
Conference location
Date Range for Data Collection (Start Date)
Date Range for Data Collection (End Date)
Digital Object Identifier
Series name and number
Volume number
Issue number
Publisher
Publisher DOI
Journal Issue
Comments
Suggested Citation: Guha, R. and S. Sarkar. (2005). "The Impact of Imperfect Information in Multi-Channel Wireless Systems" Proceedings of the 44th IEEE Conference on Decision and Control and the European Control Conference. Seville, Spain. December 12-15, 2005. ©2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Recommended citation
Collection