Date of this Version
We propose a method for optical nanoimaging in which the structure of a three-dimensional inhomogeneous medium may be recovered from far-field power measurements. Neither phase control of the illuminating field nor phase measurements of the scattered field are necessary. The method is based on the solution to the inverse scattering problem for a system consisting of a weakly-scattering dielectric sample and a strongly-scattering nanoparticle tip. Numerical simulations are used to illustrate the results.
Date Posted: 30 November 2010
This document has been peer reviewed.