Mathematical Basis for X-Ray Crystallography and Analysis of Diffraction Patterns
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Date
7-25-2016
Description
Relate Fourier transform of finite sum of Gaussians to peak widths in X-ray scattering measurements. Analogy with diffraction gratings for visible light. Peak width and crystal perfection. The Scherrer Equation. Strain broadening. Williamson-Hall plots. Instrumental resolution. Time 9:04.
Keywords
Peak width, correlation length, crystal size, Scherrer, Williamson-Hall, resolution
Disciplines
Mathematics | Physics
Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial 4.0 License
Comments
Videos 3.1-3.9 are the most mathematical in the series, and require some knowledge of vectors and calculus. The most calculus-heavy videos are 3.1-3.5, and these can be skipped by those with less mathematical background.