Scattering from Interfaces, Reflectivity, and Grazing-Incidence Scattering

Videos 6.1-6.3 discuss scattering from interfaces or thin films deposited on substrates, including reflectivity and grazing incidence scattering. These videos are independently accessible without viewing those in previous sections.

 

 

X-Ray Scattering Lecture Series

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  • Publication
    6.3 - Grazing Incidence Scattering
    (2016-08-15) Heiney, Paul A.
    Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-ray Scattering (GIXS) is used to probe the internal structure of thin films on solid or liquid substrates. Time 3:52.
  • Publication
    6.1 - Reflections from Sharp Interfaces
    (2016-08-10) Heiney, Paul A.
    An introduction to scattering from interfaces such as surfaces of solids or liquids. Laws of reflection and refraction as applied to X-rays. Features of X-ray reflectivity. X-ray mirrors. Time 7:15.
  • Publication
    6.2 - Thin Film Reflectivity
    (2016-08-15) Heiney, Paul A.
    Reflection from thin films on a substrate result in oscillations called Kiessig fringes. Calculation of reflectivity from multiple or graded interfaces. Examples of reflectivity profiles from thin films on silicon or water. Time 5:10