Department of Physics Papers
Document Type
Journal Article
Date of this Version
9-6-1993
Publication Source
Physical Review Letters
Volume
71
Issue
10
Start Page
1569
Last Page
1572
DOI
10.1103/PhysRevLett.71.1569
Abstract
Novel methods were used to generate and analyze new 15 term high temperature series for both the (connected) susceptibility χ and the structure factor (disconnected susceptibility) χd for the random field Ising model with dimensionless coupling K=J/kT, in general dimension d. For both the bimodal and the Gaussian field distributions, with mean square field J2g, we find that (χd-χ)/K2gχ2=1 as T→Tc(g), for a range of [h2]=J2g and d=3,4,5. This confirms the exponent relation γ¯=2γ (where χd~t−γ¯, χ~t−γ, t=T-Tc) providing that random field exponents are determined by two (and not three) independent exponents. We also present new accurate values for γ.
Recommended Citation
Gofman, M., Adler, J., Aharony, A., Harris, A., & Schwartz, M. (1993). Evidence for Two Exponent Scaling in the Random Field Ising Model. Physical Review Letters, 71 (10), 1569-1572. http://dx.doi.org/10.1103/PhysRevLett.71.1569
Date Posted: 20 August 2015
This document has been peer reviewed.