Department of Physics Papers

Document Type

Journal Article

Date of this Version

7-1-1978

Publication Source

Physical Review B

Volume

18

Issue

1

Start Page

416

Last Page

420

DOI

10.1103/PhysRevB.18.416

Abstract

We use low-density series expansions to calculate critical exponents for the behavior of random resistor networks near the percolation threshold as a function of the spatial dimension d. By using scaling relations, we obtain values of the conductivity exponent μ. For d=2 we find μ=1.43±0.02, and for d=3, μ=1.95±0.03, in excellent agreement with the experimental result of Abeles et al. Our results for high dimensionality agree well with the results of ε-expansion calculations.

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Date Posted: 12 August 2015

This document has been peer reviewed.