Department of Physics Papers

Document Type

Journal Article

Date of this Version

4-11-1977

Publication Source

Physical Review Letters

Volume

38

Issue

15

Start Page

796

Last Page

799

DOI

10.1103/PhysRevLett.38.796

Abstract

We present numerical data and scaling theories for the critical behavior of random resistor networks near the percolation threshold. We determine the critical exponents of a suitably defined resistance correlation function by a Padé analysis of low-concentration expansions as a function of dimensionality. We verify that d=6 is the critical dimensionality for the onset of mean-field behavior. We use the coherent-potential approximation to construct a mean-field scaling function for the critical region.

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Date Posted: 12 August 2015

This document has been peer reviewed.