
Department of Physics Papers
Document Type
Journal Article
Date of this Version
1-25-2011
Abstract
Video microscopy is employed to study the melting behaviors of multilayer colloidal crystals composed of diameter-tunable microgel spheres confined between two walls.We systematically explore film thickness effects on the melting process and on the phase behaviors of single crystal and polycrystalline films. Thick films (>4 layers) are observed to melt heterogeneously, while thin films ( ≤ 4 layers) melt homogeneously, even for polycrystalline films. Grain-boundary melting dominates other types of melting processes in polycrystalline films thicker than 12 layers. The heterogeneous melting from dislocations is found to coexist with grain-boundary melting in films between 5- and 12-layers. In dislocation melting, liquid nucleates at dislocations and forms lakelike domains embedded in the larger crystalline matrix; the “lakes” are observed to diffuse, interact, merge with each other, and eventually merge with large strips of liquid melted from grain boundaries. Thin film melting is qualitatively different: thin films homogeneously melt by generating many small defects which need not nucleate at grain boundaries or dislocations. For three- and four-layer thin films, different layers are observed to have the same melting point, but surface layers melt faster than bulk layers. Within our resolution, two- to four-layer films appear to melt in one step, while monolayers melt in two steps with an intermediate hexatic phase.
Recommended Citation
Peng, Y., Wang, Z., Alsayed, A. M., Yodh, A. G., & Han, Y. (2011). Melting of Multilayer Colloidal Crystals Confined Between Two Walls. Retrieved from https://repository.upenn.edu/physics_papers/114
Date Posted: 27 January 2011
This document has been peer reviewed.
Comments
Suggested Citation:
Y. Peng, Z.-R. Wang, A.M. Alsayed, A.G. Yodh and Y. Han. (2011). "Melting of multilayer colloidal crystals confined between two walls." Physical Review E. 83, 011404.
© 2011 The American Physical Society
http://dx.doi.org/10.1103/PhysRevE.83.011404.