PST TiAl samples of different orientations were prepared and deformed by compression at room temperature. The deformation structures on the free surfaces were scanned using an AFM. It was found that when the angle between the lamellar interfaces and the loading axis is between 20 degree and 80 degree, PST samples deform primarily by shear in slip planes parallel to the lamellar interfaces. When the angle is below 20 degree, both the gamma phase and the alpha 2 phase deform by shear in slip planes inclined with the lamellar interfaces, but the shear vectors lie in the interface. When the angle is close to 90 degree, complex deformation behavior occurs. Shear in planes parallel to the lamellar interfaces contributes more to the overall strain in the directions perpendicular to the loading axis and the out-of-plane shear contributes to the strain in the compression direction. The characteristic U-shape curve of the yield stress versus the angle between the loading axis and the lamellar interfaces can be explained quite well using different C.R.S.S. for the three different deformation modes.