Departmental Papers (MSE)

Document Type

Journal Article

Date of this Version

9-2009

Abstract

Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.

Comments

Copyright 2009 Materials Research Society. Reprinted from:

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale. Bonnell DA, Kalinin SV, Kholkin AL, et al. MRS BULLETIN, 34:9, 648-657, SEP 2009
URL: http://www.mrs.org/s_mrs/sec_subscribe.asp?CID=24169&DID=250465&action=detail

Keywords

SCANNING PROBE MICROSCOPY, NONLINEAR DIELECTRIC MICROSCOPY, FERROELECTRIC DATA-STORAGE, THIN-FILMS, SINGLE-CRYSTALS, ULTRAHIGH DENSITY, LOCAL REACTIVITY, POLARIZATION, SURFACES, NANOSTRUCTURES

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Date Posted: 01 October 2009