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We present real-time transmission electron microscopy of nanogap formation by feedback controlled electromigration that reveals a remarkable degree of crystalline order. Crystal facets appear during feedback controlled electromigration indicating a layer-by-layer, highly reproducible electromigration process avoiding thermal runaway and melting. These measurements provide insight into the electromigration induced failure mechanism in sub-20 nm size interconnects, indicating that the current density at failure increases as the width decreases to approximately 1 nm.
molecular electronic devices, electronic structure of nanoscale materials, electrical properties of metal-to-metal contacts, nanoscale contacts (electronic transpor
Strachan, D. R., Johnston, D. E., Guitton, B. S., Datta, S. S., Davies, P. K., Bonnell, D. A., & Johnson, A. T. (2008). Real-Time TEM Imaging of the Formation of Crystalline Nanoscale Gaps. Retrieved from https://repository.upenn.edu/mse_papers/143
Date Posted: 20 March 2008
This document has been peer reviewed.