Departmental Papers (MSE)

Document Type

Journal Article

Date of this Version

April 2007


An equation was developed for calculating the time to failure by slow crack growth (SCG) failure in any polyethylene structure. The equation requires the following experimental inputs: (1) the resistance to SCG as measured by the PENT test (ASTM F1473), (2) the stress intensity of the defect from which failure originates, and (3) the temperature. A simple experiment for determining the stress intensity is presented. The equation was applied to SCG failures that are associated with the inherent random defects that occur in the wall of all pipes. The size of the inherent random defect that exists in commercial gas pipes was found to be 0.14 mm.


Postprint version. Published in Polymer Engineering and Science, Volume 47, Issue 4, April 2007, 477-480.
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Date Posted: 29 May 2007

This document has been peer reviewed.