Departmental Papers (ESE)

Abstract

A new all-digital background calibration method, using a piecewise linear model to estimate the stage error pattern, is presented. The method corrects both linear and nonlinear errors. The proposed procedure converges in a few milliseconds and requires low hardware overhead, without the need of a high-capacity ROM or RAM. The calibration procedure is tested on a 0.6- µm CMOS pipeline analog-to-digital converter (ADC), which suffers from a high degree of nonlinear errors. The calibration gives improvements of 17 and 26 dB for signal-noise-and-distortion ratio (SNDR) and spurious-free dynamic range (SFDR), respectively, for the Nyquist input signal at the sampling rate of 33 MSample/s. The calibrated ADC achieves SNDR of 70.3 dB and SFDR of 81.3 dB at 33 MSample/s, which results in a resolution of about 12 b.

Document Type

Journal Article

Date of this Version

February 2008

Comments

Copyright 2008 IEEE. Reprinted from IEEE Transactions on Circuits and Systems, Regular Papers-I, Volume 55, Issue 1, February 2008, pages 311-321.

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Keywords

analog-to-digital converter (ADC), background calibration, CMOS ADC, nonlinear error calibration, pipeline ADC

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Date Posted: 09 April 2008

This document has been peer reviewed.