Far-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulations

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Electrical and Computer Engineering
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Salandrino, Alessandro
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Here we suggest and explore theoretically an idea for a far-field scanless optical microscopy with a subdiffraction resolution. We exploit the special dispersion characteristics of an anisotropic metamaterial crystal that is obliquely cut at its output plane, or has a curved output surface, in order to map the input field distribution onto the crystal’s output surface with a compressed angular spectrum, resulting in a "magnified" image. This can provide a far-field imaging system with a resolution beyond the diffraction limits while no scanning is needed.

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2006-08-01
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Copyright American Physical Society> Reprinted from Physical Review B, Volume 74, Issue 7, Article 075103, August 2006, 5 pages. Publisher URL: http://dx.doi.org/10.1103/PhysRevB.74.075103
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