Data Flow Testing as Model Checking

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dc.contributor.authorLee, Insup
dc.contributor.authorSokolsky, Oleg
dc.contributor.authorLee, Insup
dc.contributor.authorSokolsky, Oleg
dc.contributor.authorUral, Hasan
dc.date2023-05-16T22:25:15.000
dc.date.accessioned2023-05-22T12:52:00Z
dc.date.available2023-05-22T12:52:00Z
dc.date.issued2003-05-03
dc.date.submitted2005-03-29T14:57:48-08:00
dc.description.abstractThis paper presents a model checking-based approach to data flow testing. We characterize data flow oriented coverage criteria in temporal logic such that the problem of test generation is reduced to the problem of finding witnesses for a set of temporal logic formulas. The capability of model checkers to construct witnesses and counterexamples allows test generation to be fully automatic. We discuss complexity issues in minimal cost test generation and describe heurstic test generation algorithms. We illustrate our approach using CTL as temporal logic and SMV as model checker.
dc.description.commentsCopyright 2003 IEEE. Reprinted from <i>Proceedings of the 25th International Conference on Software Engineering 2003 (ICSE 2003)</i>, pages 232-242.<br> Publisher URL: <a href="http://dx.doi.org/10.1109/ICSE.2003.1201203" >http://dx.doi.org/10.1109/ICSE.2003.1201203</a> <br><br> This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Pennsylvania's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
dc.description.comments<br>Copyright 2003 IEEE. Reprinted from <i>Proceedings of the 25th International Conference on Software Engineering 2003 (ICSE 2003)</i>, pages 232-242.<br> Publisher URL: http://dx.doi.org/10.1109/ICSE.2003.1201203 <br><br> This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Pennsylvania's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. <br><p>
dc.identifier.urihttps://repository.upenn.edu/handle/20.500.14332/6963
dc.legacy.articleid1106
dc.legacy.fulltexturlhttps://repository.upenn.edu/cgi/viewcontent.cgi?article=1106&amp;context=cis_papers&amp;unstamped=1
dc.source.issue90
dc.source.journalDepartmental Papers (CIS)
dc.source.peerreviewedtrue
dc.source.statuspublished
dc.subject.otherSoftware testing
dc.subject.othercoverage criteria
dc.subject.otherautomatic test generation
dc.subject.othermodel checking
dc.subject.otherdata-flow graph
dc.titleData Flow Testing as Model Checking
dc.typePresentation
digcom.contributor.authorHong, Hyoung Seok
digcom.contributor.authorCha, Sung Deok
digcom.contributor.authorisAuthorOfPublication|email:lee@cis.upenn.edu|institution:University of Pennsylvania|Lee, Insup
digcom.contributor.authorisAuthorOfPublication|email:sokolsky@cis.upenn.edu|institution:University of Pennsylvania|Sokolsky, Oleg
digcom.contributor.authorUral, Hasan
digcom.identifiercis_papers/90
digcom.identifier.contextkey52395
digcom.identifier.submissionpathcis_papers/90
digcom.typeconference
dspace.entity.typePublication
relation.isAuthorOfPublication45a9eed5-3211-4c36-b40d-6394302dfdce
relation.isAuthorOfPublication45a9eed5-3211-4c36-b40d-6394302dfdce
relation.isAuthorOfPublication35e1b18e-15fe-4438-be3b-84593f70a40a
relation.isAuthorOfPublication.latestForDiscovery45a9eed5-3211-4c36-b40d-6394302dfdce
upenn.schoolDepartmentCenterDepartmental Papers (CIS)
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