Date of this Version
A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.
inverse problems, near-field scanning optical microscopy, optical tomography
Sun, J., Carney, P. S., & Schotland, J. C. (2007). Strong Tip Effects in Near-field Scanning Optical Tomography. Retrieved from https://repository.upenn.edu/be_papers/102
Date Posted: 15 January 2008
This document has been peer reviewed.