Date of this Version
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influence of experimental conditions such as tip radius of curvature, indentation force, and cantilever stiffness on PFM image contrast. These results are used to construct contrast mechanism maps, which correlate the imaging conditions with the dominant contrast mechanisms. Conditions under which materials properties can be determined quantitatively are elucidated.
piezoresponse force microscopy, PFM, ferroelectric domain structures, electromechanical interactions, tip-surface junction, tip radius of curvature
Kalinin, S. V., & Bonnell, D. A. (2002). Contrast mechanism maps for piezoresponse force microscopy. Retrieved from http://repository.upenn.edu/mse_papers/5
Date Posted: 18 October 2004
This document has been peer reviewed.