Nanoimpedance Microscopy and Spectroscopy

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Departmental Papers (MSE)
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Kalinin, Sergei V
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One of the key limiting factors in current-based scanning probe microscopies (SPM) is the quality of tip-sample contact and stray capacitance in the probe-surface junction. We conduct impedance spectroscopy over a broad frequency range (40Hz~110MHz) through an AFM tip to quantify local electrical properties. Equivalent circuit for the tip-surface contact is constructed based on the impedance data and is used to study the mechanisms of relaxation in the near-tip region. Relative contributions of tip-surface contact and materials properties to the signal are discussed. This technique, referred to as Nanoimpedance Microscopy/Spectroscopy, is demonstrated in the imaging of an electronic ceramic: a ZnO varistor. Analysis of impedance spectra allows separation of tip-surface interactions and grain boundary behavior.

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2002-12-02
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Departmental Papers (MSE)
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2023-05-16T21:39:57.000
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Copyright Materials Research Society. Reprinted from MRS Proceedings Volume 738. 2002 Fall Meeting Symposium G Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Publisher URL: http://www.mrs.org/members/proceedings/fall2002/g/G4_4.pdf
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