Date of this Version
We present real-time transmission electron microscopy of nanogap formation by feedback controlled electromigration that reveals a remarkable degree of crystalline order. Crystal facets appear during feedback controlled electromigration indicating a layer-by-layer, highly reproducible electromigration process avoiding thermal runaway and melting. These measurements provide insight into the electromigration induced failure mechanism in sub-20 nm size interconnects, indicating that the current density at failure increases as the width decreases to approximately 1 nm.
molecular electronic devices, electronic structure of nanoscale materials, electrical properties of metal-to-metal contacts, nanoscale contacts (electronic transpor
Date Posted: 20 March 2008
This document has been peer reviewed.