Departmental Papers (MEAM)

Document Type

Journal Article

Date of this Version

January 2001

Comments

Copyright (2001) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Reprinted in Applied Physics Letters, Volume 78, Issue 3, Article 317, January 2001, 317-319 pages.


NOTE: At the time of publication, author Robert W. Carpick was affiliated with the University of Wisconsin. Currently (June 2007), he is a faculty member in the Department of Mechanical Engineering and Applied Mechanics at the University of Pennsylvania. Publisher URL: http://dx.doi.org/10.1063/1.1341225

Abstract

We describe a technique, based on shear force microscopy, that allows one to detect shear forces in a chosen direction at the nanometer scale. The lateral direction of an oscillating probe tip is determined by selecting which of the four quadrants are excited on the piezo driver. The shear forces depend directly on this lateral direction if structural anisotropies are present, as confirmed with polydiacetylene monolayers. (C) 2001 American Institute of Physics.

Keywords

scanning probe microscope, monolayers, polymer films

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Date Posted: 25 June 2007

This document has been peer reviewed.