Date of this Version
We describe a technique, based on shear force microscopy, that allows one to detect shear forces in a chosen direction at the nanometer scale. The lateral direction of an oscillating probe tip is determined by selecting which of the four quadrants are excited on the piezo driver. The shear forces depend directly on this lateral direction if structural anisotropies are present, as confirmed with polydiacetylene monolayers. (C) 2001 American Institute of Physics.
scanning probe microscope, monolayers, polymer films
Burns, A. R. and Carpick, Robert W., "Directional shear force microscopy" (2001). Departmental Papers (MEAM). Paper 92.
Date Posted: 25 June 2007
This document has been peer reviewed.