Directional shear force microscopy

Loading...
Thumbnail Image
Penn collection
Departmental Papers (MEAM)
Degree type
Discipline
Subject
scanning probe microscope
monolayers
polymer films
Funder
Grant number
License
Copyright date
Distributor
Related resources
Author
Contributor
Abstract

We describe a technique, based on shear force microscopy, that allows one to detect shear forces in a chosen direction at the nanometer scale. The lateral direction of an oscillating probe tip is determined by selecting which of the four quadrants are excited on the piezo driver. The shear forces depend directly on this lateral direction if structural anisotropies are present, as confirmed with polydiacetylene monolayers. (C) 2001 American Institute of Physics.

Advisor
Date Range for Data Collection (Start Date)
Date Range for Data Collection (End Date)
Digital Object Identifier
Series name and number
Publication date
2001-01-15
Journal title
Volume number
Issue number
Publisher
Publisher DOI
Journal Issue
Comments
Copyright (2001) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Reprinted in Applied Physics Letters, Volume 78, Issue 3, Article 317, January 2001, 317-319 pages. NOTE: At the time of publication, author Robert W. Carpick was affiliated with the University of Wisconsin. Currently (June 2007), he is a faculty member in the Department of Mechanical Engineering and Applied Mechanics at the University of Pennsylvania. Publisher URL: http://dx.doi.org/10.1063/1.1341225
Recommended citation
Collection