
Departmental Papers (MEAM)
Title
A Comparative Study of Biomechanical Simulators in Deformable Registration of Brain Tumor Images
Document Type
Journal Article
Date of this Version
March 2008
Abstract
Simulating the brain tissue deformation caused by tumor growth has been found to aid the deformable registration of brain tumor images. In this paper, we evaluate the impact that different biomechanical simulators have on the accuracy of deformable registration. We use two alternative frameworks for biomechanical simulations of mass effect in 3-D magnetic resonance (MR) brain images. The first one is based on a finite-element model of nonlinear elasticity and unstructured meshes using the commercial software package ABAQUS. The second one employs incremental linear elasticity and regular grids in a fictitious domain method. In practice, biomechanical simulations via the second approach may be at least ten times faster. Landmarks error and visual examination of the coregistered images indicate that the two alternative frameworks for biomechanical simulations lead to comparable results of deformable registration. Thus, the computationally less expensive biomechanical simulator offers a practical alternative for registration purposes.
Keywords
biomechanical model, brain tumor, deformable registration, tumor growth simulation
Date Posted: 09 April 2008
This document has been peer reviewed.

Comments
For IEEE Journal Article: Copyright 2008 IEEE. Reprinted from IEEE Transactions on Biomedical Engineering, Volume 55, Issue 3, March 2008, pages 1233-1236. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Pennsylvania's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.