Departmental Papers (ESE)

Abstract

As computer automation continues to increase in our society, the need for greater radiation reliability is necessary. Already critical infrastructure is failing too frequently. In this paper, we will introduce the Cross-Layer Reliability concept for designing more reliable computer systems.

Document Type

Journal Article

Date of this Version

6-1-2011

Comments

Suggested Citation:
Quinn, H., Manuzzato, A., Graham, P., DeHon, A. and Carter, N. (2011). High-Reliability Computing For The Smarter Planet. Application of Accelerators in Research and Industry. AIP Conf. Proc. 1336, 665-668.

© 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in AIP Conference Proceedings and may be found at http://dx.doi.org/10.1063/1.3586185.

Keywords

Reliability, Computing, Radiation Effects in Semiconductors

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Date Posted: 23 June 2011

This document has been peer reviewed.