Departmental Papers (ESE)

Document Type

Journal Article

Date of this Version

March 2008

Comments

Postprint version. Published in Nanotechnology, Volume 19, Issue 11, Article 115708, March 2008, 31 pages.
Publisher URL: http://dx.doi.org/10.1088/0957-4484/19/11/115708

Abstract

Shrinking feature sizes and energy levels coupled with high clock rates and decreasing node capacitance lead us into a regime where transient errors in logic cannot be ignored. Consequently, several recent studies have focused on feed-forward spatial redundancy techniques to combat these high transient fault rates. To complement these studies, we analyze fine-grained rollback techniques and show that they can offer lower spatial redundancy factors with no significant impact on system performance for fault rates up to one fault per device per ten million cycles of operation (Pƒ = 10-7) in systems with 1012 susceptible devices. Further, we concretely demonstrate these claims on nanowire-based programmable logic arrays. Despite expensive rollback buffers and general-purpose, conservative analysis, we show the area overhead factor of our technique is roughly an order of magnitude lower than a gate level feed-forward redundancy scheme.

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Date Posted: 05 May 2008

This document has been peer reviewed.