Departmental Papers (ESE)

Document Type

Conference Paper

Date of this Version

May 2006

Comments

Copyright 2006 IEEE. Reprinted from Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS 2006), May 2006, pages 3574-3577. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Pennsylvania's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Abstract

We present a CMOS image sensor capable of both voltage- and current-mode operations. Each pixel on the image has a single transistor acting as either source follower for voltage readout, or transconductor for current readout. The two modes share the same readout lines, but have their own correlated double sampling (CDS) units for noise suppression. We also propose a novel current-mode readout technique using a velocity saturated short-channel transistor, which achieves high linearity. The 300x200 image array is a mixture of 3 types of pixels with identical photodiodes and access switches; while the readout transistors are sized for their designated mode of operation. This ensures a fair comparison on the performance of the different modes.

Keywords

CMOS imager, Image sensor, current-mode, voltage-mode image sensor

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Date Posted: 27 June 2007

This document has been peer reviewed.