Departmental Papers (CIS)

Document Type

Conference Paper

Date of this Version

4-8-2002

Comments

Postprint version. Published in Lecture Notes in Computer Science, Volume 2280, Tools and Algorithms for the Construction and Analysis of Systems : 8th International Conference, 2002, (TACAS 2002), pages 327-341.
Publisher URL: http://springerlink.metapress.com/link.asp?id=105633

Abstract

This paper presents a theory of test coverage and generation from specifications written in extended finite state machines (EFSMs). We investigate a family of coverage criteria based on the information of control flow and data flow in EFSMs and characterize them using the temporal logic CTL. We discuss the complexity of minimal cost test generation and describe a simple heuristic which uses the capability of model checkers to construct counterexamples. Our approach extends the range of applications of model checking from automatic verification of finite state systems to automatic test generation from finite state systems.

Keywords

Automatic test generation, coverage criteria, model checking

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Date Posted: 28 April 2005

This document has been peer reviewed.