Departmental Papers (CIS)
Document Type
Conference Paper
Date of this Version
May 2003
Abstract
This paper presents a model checking-based approach to data flow testing. We characterize data flow oriented coverage criteria in temporal logic such that the problem of test generation is reduced to the problem of finding witnesses for a set of temporal logic formulas. The capability of model checkers to construct witnesses and counterexamples allows test generation to be fully automatic. We discuss complexity issues in minimal cost test generation and describe heurstic test generation algorithms. We illustrate our approach using CTL as temporal logic and SMV as model checker.
Keywords
Software testing, coverage criteria, automatic test generation, model checking, data-flow graph
Date Posted: 12 April 2005
This document has been peer reviewed.
Comments
Copyright 2003 IEEE. Reprinted from Proceedings of the 25th International Conference on Software Engineering 2003 (ICSE 2003), pages 232-242.
Publisher URL: http://dx.doi.org/10.1109/ICSE.2003.1201203
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