Date of this Version
The relationship between sample structure and data in volume-scanning backscattering mode near-field optical microscopy is investigated. It is shown that the three-dimensional structure of a dielectric sample is encoded in the phase and amplitude of the scattered field and that an approximate reconstruction of the sample structure may be obtained.
Sun, J., Schotland, J. C., Hillenbrand, R., & Carney, P. S. (2009). Nanoscale Optical Tomography using Volume-scanning Near-field Microscopy. Retrieved from http://repository.upenn.edu/be_papers/171
Date Posted: 30 November 2010
This document has been peer reviewed.