Strong Tip Effects in Near-field Scanning Optical Tomography
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inverse problems
near-field scanning optical microscopy
optical tomography
near-field scanning optical microscopy
optical tomography
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A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.
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2007-11-15
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Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Reprinted in Journal of Applied Physics, Volume 102, Issue 10, Article 103103, November 2007. Publisher URL: http://dx.doi.org/10.1063/1.2812545