Date of this Version
A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.
inverse problems, near-field scanning optical microscopy, optical tomography
Date Posted: 15 January 2008
This document has been peer reviewed.