Departmental Papers (BE)
Document Type
Journal Article
Date of this Version
November 2007
Abstract
A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.
Keywords
inverse problems, near-field scanning optical microscopy, optical tomography
COinS
Date Posted: 15 January 2008
This document has been peer reviewed.
Comments
Copyright 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. Reprinted in Journal of Applied Physics, Volume 102, Issue 10, Article 103103, November 2007.
Publisher URL: http://dx.doi.org/10.1063/1.2812545